Solder joint reliability in flip chip package with surface treatment of ENIG under thermal shock test
Sang-Su Ha, Sang-Ok Ha, Jin-Kyu Jang, Jeong-Won Yoon, Jong-Woong Kim, Min-Kwan Ko, Dae-Gon Kim, Myung-Wan Ko and Seung-Boo Jung.
Metals and Materials International,
15,
655
(IF: 1.815)